Innovative etch solution for logic and DRAM devices at 1x and beyond
Truly symmetric chamber design
Low capacitive coupling 3D coil design
High pumping speed with large capacity turbo pump (TMP)
Precise chamber wall temperature control
Advanced plasma-resistant interior coating
Multi-zone temperature-controlled ESC
Active impedance tuned focus ring design
Switchable dual frequency RF biasing
Integrated dual strippers
Durga ESC ready for selecting
More independent ion energy and ion density controllability
Higher pumping conductance for wider process window
Excellent etch uniformity
Superior profile control for high aspect ratio application
High productivity p